Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III–V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...

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Hlavní autoři:	Geydt, Pavel, Dunaevskiy, M. S., Lähderanta, Erkki
Médium:	Online
Jazyk:	angličtina
Vydáno:	InTechOpen 2021
Témata:	scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young’s modulus thema EDItEUR::P Mathematics and Science::PH Physics::PHF Materials / States of matter::PHFC Condensed matter physics (liquid state and solid state physics)
On-line přístup:	ONIX_20210602_10.5772/intechopen.68162_335
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!