Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III–V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...

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Detalhes bibliográficos

Principais autores:	Geydt, Pavel, Dunaevskiy, M. S., Lähderanta, Erkki
Formato:	Online
Idioma:	inglês
Publicado em:	InTechOpen 2021
Assuntos:	scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young’s modulus thema EDItEUR::P Mathematics and Science::PH Physics::PHF Materials / States of matter::PHFC Condensed matter physics (liquid state and solid state physics)
Acesso em linha:	ONIX_20210602_10.5772/intechopen.68162_335
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