Atomic Force Microscopy

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...

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Bibliographic Details

Format:	Online
Language:	English
Published:	IntechOpen 2021
Subjects:	Electrochemistry & magnetochemistry thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
Online Access:	ONIX_20210420_9789535104148_1231
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