Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...

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Xehetasun bibliografikoak

Egile nagusia:	Niknahad, Mahtab
Formatua:	Online
Hizkuntza:	ingelesa
Argitaratua:	KIT Scientific Publishing 2021
Gaiak:	T1-995 Space High reliability FPGA Redundancy Single Event Upset thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
Sarrera elektronikoa:	34923
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