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Radiation Tolerant Electronics

Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiati...

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Guardat en:
Autor principal: Leroux, Paul
Format: Online
Idioma:anglès
Publicat: MDPI - Multidisciplinary Digital Publishing Institute 2021
Matèries:
TA1-2040
TK1-9971
T1-995
single event effects
n/a
radiation-hardening-by-design (RHBD)
frequency divider by two
single event upset
Image processing
CMOS analog integrated circuits
FPGA
total ionizing dose (TID)
Impulse Sensitive Function
soft error
hardening by design
radiation hardening by design
X-rays
Single-Event Upsets (SEUs)
line buffer
heavy ions
VHDL
FPGA-based digital controller
radiation hardening by design (RHBD)
radiation hardening
SRAM-based FPGA
proton irradiation
ring oscillator
sensor readout IC
fault tolerance
space application
physical unclonable function
voltage controlled oscillator (VCO)
Ring Oscillators
analog single-event transient (ASET)
single event opset (SEU)
SEB
single event upsets
bipolar transistor
total ionizing dose
protons
triple modular redundancy (TMR)
gain degradation
space electronics
saturation effect
configuration memory
Co-60 gamma radiation
total ionization dose (TID)
frequency synthesizers
CMOS
PLL
TDC
single-event upsets (SEUs)
bandgap voltage reference (BGR)
4MR
single-shot
error rates
Radiation Hardening by Design
soft errors
heavy-ions
single-event effects (SEE)
single event transient (SET)
SEE testing
proton irradiation effects
RFIC
single event upset (SEU)
FMR
ionization
radiation tolerant
triplex–duplex
neutron irradiation effects
digital integrated circuits
single event gate rupture (SEGR)
power MOSFETs
ring-oscillator
selective hardening
voltage reference
nuclear fusion
TMR
gamma-rays
gamma ray
instrumentation amplifier
radiation effects
reference circuits
radiation-hardened
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
Accés en línia:42499
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