Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV
In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...
Sábháilte in:
| Príomhchruthaitheoir: | |
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| Formáid: | Online |
| Teanga: | Gearmáinis |
| Foilsithe / Cruthaithe: |
KIT Scientific Publishing
2021
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| Ábhair: | |
| Rochtain ar líne: | 34813 |
| Clibeanna: |
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