Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...

Descripció completa

Dades bibliogràfiques

Autor principal:	Marschall, Felix
Format:	Online
Idioma:	alemany
Publicat:	KIT Scientific Publishing 2021
Matèries:	T1-995 Röntgenmikroskopie OptikX-ray microscopy Vollfeldmikroskopie Mikrostrukturtechnik refraktive Linse full-field-microscopy refractive lens optics microstructure technology thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
Accés en línia:	34813
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!