Electron Diffraction and Structural Imaging II

This Reprint continues to showcase the advances of electron diffraction (ED) and structural imaging as powerful methods for structural science. Enabled by Cs correctors, direct detection cameras, beam precession, 4DSTEM, and 3DED, these approaches now resolve structures of nanocrystals, beam-sensiti...

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Dades bibliogràfiques

Format:	Online
Idioma:	anglès
Publicat:	MDPI - Multidisciplinary Digital Publishing Institute 2026
Matèries:	Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::G Reference, Information and Interdisciplinary subjects::GP Research and information: general
Accés en línia:	ONIX_20260416T142754_9783725853618_3
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