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Characterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis Symposiumc

This Special Issue “Characterization of Nanomaterials” collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual symposium “M...

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Gespeichert in:
Format: Online
Sprache:Englisch
Veröffentlicht: MDPI - Multidisciplinary Digital Publishing Institute 2022
Schlagworte:
physical vapor deposition
magnetron sputtering
AlN/Al coating
silicon substrate
residual stresses
wafer curvature method
nanoscale residual stress profiling
indentation failure modes
nanoindentation adhesion
intermetallic phases
growth kinetics
Al–Ni system
zinc oxide
nanoparticles
paper transistors
printed electronics
electrolyte-gated transistors
microwave synthesis
oxide dissociation
doping
rare earth ions
upconversion
liquid alloys
2D materials
thin films
Ga–Sn–Zn alloys
gallium alloys
nanoanalysis
lithium-ion
nickel–manganese–cobalt oxide (NMC)
leaching
recycling
recover
degradation
SEM-EDX
Raman spectroscopy
resistive switching memories
multi-level cell
copper oxide
grain boundaries
aluminum oxide
p-type TFT
p-type oxide semiconductors
SnO electrical properties
oxide structure analysis
ToF-SIMS 3D imaging
compositional depth profiling
high aspect ratio (HAR) structures
silicon doped hafnium oxide (HSO) ALD deposition
lateral high aspect ratio (LHAR)
ToF-SIMS analysis
n/a
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
Online-Zugang:ONIX_20220111_9783036507569_512
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