Rietveld Refinement in the Characterization of Crystalline Materials

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

Podrobná bibliografie

Hlavní autor:	Igor Djerdj (Ed.)
Médium:	Online
Jazyk:	angličtina
Vydáno:	MDPI - Multidisciplinary Digital Publishing Institute 2021
Témata:	QD1-999 QD71-142 Rietveld method Structural characterization Microstructural analysis Crystalline materials Structural materials X-ray and neutron diffraction Functional materials thema EDItEUR::P Mathematics and Science::PN Chemistry
On-line přístup:	32110
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