RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...

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Xehetasun bibliografikoak

Egile nagusia:	Müller, Daniel
Formatua:	Online
Hizkuntza:	ingelesa
Argitaratua:	KIT Scientific Publishing 2021
Gaiak:	T1-995 On-Wafer Measurements Monolithic Microwave Integrated Circuits Halbleiterschaltungen Messtechnik Hochfrequenztechnik Electromagnetic Field Simulation Elektromagnetische Feldsimulation Radio Frequency thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
Sarrera elektronikoa:	34153
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