Abbildende Ellipsometrie mit Lichtwegumkehrung für die optische Charakterisierung von gekrümmten Oberflächen

Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and r...

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Autor principal:	Negara, Christian Emanuel
Format:	Online
Idioma:	alemany
Publicat:	KIT Scientific Publishing 2023
Matèries:	imaging; retroreflection; curved surface; ellipsometry; bildgebend; Retroreflexion; gekrümmte Oberfläche; Ellipsometrie; metrology; Messtechnik thema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists
Accés en línia:	OCN: 1404765154
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