Výsledky vyhledávání - error collection (code OR come)
Doporučená témata ve výsledcích tohoto hledání:
Doporučená témata ve výsledcích tohoto hledání:
- n/a 7
- thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues 4
- thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology 4
- deep learning 3
- object detection 3
- thema EDItEUR::G Reference, Information and Interdisciplinary subjects::GP Research and information: general 3
- COVID-19 2
- convolutional neural networks 2
- generative adversarial network 2
- image classification 2
- image processing 2
- machine learning 2
- portfolio optimization 2
- support vector machine 2
- time series 2
- video surveillance 2
- 1)) 1
- 1D quadratic chaotic system 1
- 3D 1
- 3D NAND Flash 1
- 3D NAND Flash memories 1
- 3D NAND flash memory 1
- 3D flash memory 1
- 5G IoT network 1
- 5G core network slice 1
- 5G mobile communication network 1
- 5G networks 1
- A 1
- A-RoF 1
- ADCC-GARCH 1
Alternativní vyhledávání:
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Signatures of Maturity in Cryptocurrency Market
Vydáno 2023Témata: “…error correcting code…”
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Coding Theory Essentials
Vydáno 2023“…This edited book brings together the expertise of leading researchers and practitioners to explore the intricate world of coding theory. From error-correcting codes to channel capacity, from block codes to convolutional codes, this collection covers a wide range of topics, providing both theoretical foundations and practical insights. …”
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Analog Circuits
Vydáno 2021“…In this book, a new architecture for a SAR ADC is proposed to eliminate the process mismatches and minimize the errors. A collection of DG-MOSFET based analog/RFICs present the excellent performance; the automated system for a passive filter circuits design is presented with the local searching engaging; interval analysis is used to solve some problems for linear and nonlinear analog circuits and a symbolic method is proposed to solve the testability problem.…”
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